[Spotlight 2023]
Bulk-fin field-effect transistor-based capacitorless dynamic random-access memory and its immunity to the work-function variation effect
2023 Jpn. J. Appl. Phys. 62 SC1016

iopscience.iop.org/article/10.3...

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#physics
#Capacitorless
#DRAM
#reliability
#TCAD
#Simulation