#Journals | #EPJAppliedPhysics
"The reliability impact of N doping on the HfO2 charge-trapping layer: a first-principles study"
✍️Fengyu Ye_from #WuhanUniversity
👀Explore the cutting-edge research in material science and semiconductor technology!

➡️ bit.ly/3WWSf0v
#EDPSciences #OpenAccess#Physic